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These methods are designed for collecting data with a reflectorless instrument where the actual computed point is obstructed by trees, bushes, or even around a corner. They are also excellent for collecting the insides of a building, because furniture or plants often block many corners on floors and ceilings.
- A Two Line Offset Intersection:
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Define two points on two
different reference lines and FieldGenius will compute a new point at the
intersection of the two reference lines.
This is designed to compute a point where the actual point is obstructed. |
- A Line and Angle Offset intersection routine:
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FieldGenius can compute the
location of a hidden point by defining two points on a reference line and
measuring an angle to that which defines where the point would intersect the
reference line. |
- A line and Distance offset routine:
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You can now shoot two points
to define a reference line, and then specify offsets in three directions to
compute the location of a hidden point. You can specify an offset along the reference line, right/left and
up/down. |
- A line and Perpendicular Point offset routine:
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You can now shoot two points
to define a reference line, and then specify an existing point or shoot a
location, and FieldGenius will compute the perpendicular intersection from
this point to the reference line. |
- Improved storing descriptions when points are
stored. Now available is an edit field
that allows you to quickly enter your descriptions:
- As soon as you start typing, a
drop down list appears with the descriptions from your AutoMap library. When you find the description you need,
simply press enter to use it.
- While the list is open, you
can use your arrow keys to scroll through the list.
- Next to the field is a new
button called List. Press this to open
the AutoMap Library screen.
- Beta testers reported that the
improvements to FieldGenius increased productivity by 15%!
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Jump to: General Features | Figures | Instrument Control | Calculation
© 2007 MicroSurvey Software Inc. MicroSurvey® is registered with the U.S. Patent and Trademark Office. 
